Bettersize Patents a Fix for the Sediment Industry’s Dirtiest Problem

US Patent 12,680,936 B2 lets the DeepSizer 300 cancel lens contamination mathematically, ending the scrub-and-redeploy cycle in field monitoring.

COSTA MESA, CA, UNITED STATES, August 7, 2026 /EINPresswire.com/ — Bettersize Instruments today announced it has been granted US Patent 12,680,936 B2 for Differential Path Measurement, closing out a problem that has limited in-situ sediment monitoring for years: window contamination on submerged optical sensors. The USPTO issued the patent on July 14, 2026, to Bettersize Instruments. It is the core technology inside the DeepSizer 300, Bettersize’s in-situ sediment monitor for rivers, ports, and oceans.

The problem the patent solves is simple to state and expensive to ignore: any optical sensor left in a river or harbor for weeks at a time gets its window fouled. That fouling corrupts the light-scattering signal the instrument depends on, and there’s no way to pull a clean background reading from water that’s never clean to begin with. Operators have lived with the trade-off for years — pull the sensor, scrub it, redeploy, repeat.

Bettersize’s patented method removes the trade-off. The DeepSizer 300 takes two simultaneous readings through the same fouled window — one over a long optical path, one over a short one — then subtracts them. Because the contamination sits in both signals equally, the subtraction cancels it out and leaves only the true particle-scattering signal underneath. The instrument then runs its Mie scattering and solid-content calculations on that clean signal, with no pure-medium baseline required.

What that means in the field:
– Accurate results. Window contamination is removed from the measurement itself, not worked around.
– Lower maintenance. Less cleaning, less downtime, lower operating cost per deployment.
– Reliable monitoring. Continuous, unbiased data through changing, turbid two-phase flows.
– Greater flexibility. Long-term deployment across rivers, oceans, ports, and industrial water systems.

The DeepSizer 300 is available now. Technical details on the differential path method, including the underlying Mie scattering and solid-content equations, are available in Bettersize’s Knowledge Center.

Learn More DeepSizer 300: https://www.bettersizeinstruments.com/products/deepsizer-300-submersible-particle-size-analyzer/

About Bettersize Instruments
Bettersize Instruments designs and manufactures particle characterization instruments, including laser diffraction, dynamic light scattering, and image analysis systems, serving industries from pharmaceuticals to mining and environmental monitoring worldwide.

Ricky Ponting
Bettersize Instruments Ltd.
+86 755-26926582
info@bettersize.com
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